
Modeling of Electrical Overstress in Integrated Circuits
Carlos H. Diaz, Sung-Mo Kang, Charvaka Duvvury
1995
xvix + 148 pages
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1995
xvix + 148 pages
This book covers techniques for modeling electrical overstress and electrostatic discharge failures in integrated circuits. It is written at a technical level for engineers, designers, and specialists in the fields of EOS/ESD and power failures. A good reference to have in your library.